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Received: 23 April 1997/Accepted: 30 July 1997
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Scholz, R., Gösele, U., Wischmeyer, F. et al. Prevention of micropipes and voids at β-SiC/Si(100) interfaces . Appl Phys A 66, 59–67 (1998). https://doi.org/10.1007/s003390050638
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DOI: https://doi.org/10.1007/s003390050638