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Resonant inelastic scattering in dilute magnetic semiconductors by soft X-ray fluorescence spectroscopy

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MnxS (where 0.05<x<1) were measured as the energy of the exciting radiation was tuned across the S and Mn-L2,3 absorption edges of these compounds. Strong resonance peaks in Mn-L emission spectra and the systematic appearance of new spectral features in S-L emission spectra were observed. Partial substitution of Zn by a magnetic Mn ion results in strong hybridization of the Mn 3d orbitals with the sp band of the host semiconductor. A detailed study of resonant inelastic scattering in the vicinity of the S and Mn-L2,3 absorption edges of these DMS is presented.

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Received: 6 March 1997

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Lawniczak-Jablonska, K., Jia, J., Lin, L. et al. Resonant inelastic scattering in dilute magnetic semiconductors by soft X-ray fluorescence spectroscopy . Appl Phys A 65, 173–177 (1997). https://doi.org/10.1007/s003390050561

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  • DOI: https://doi.org/10.1007/s003390050561

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