Abstract
Anisotropic conductive film (ACF) is an electrical and electronic material composed of conductive balls embedded in a polymer matrix. ACF plays a crucial role in connecting electrodes and chips in Micro-LEDs. It serves as the target material in the repair process, enhancing production yield. For the application of ACF in the Micro-LED display repair process, flawless selective micro-ablation is essential. However, little research related to ACF micro-ablation has been conducted so far. In this study, we investigated a detailed analysis of the ablation area and defects in ACF by using femtosecond lasers with three different wavelengths: 1026 nm (NIR), 513 nm (Green), and 257 nm (DUV) for selective micro-ablation. By conducting a comparative analysis of these wavelengths, we determined that the optimal ablation results were achieved using a 257 nm wavelength femtosecond laser. These results exhibited no-defect, uniform, reproducible, and symmetrical ablation characteristic, making it suitable for the Micro-LED display repair process. This research is expected to establish the foundation for micro-ablation in all applications where ACF is employed.
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The data that support the findings of this study are available from the corresponding author upon reasonable request.
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Junha Choi and Sung-Hak Cho conceived of the presented idea. Junha Choi developed the theory and performed the experiments. Junha Choi and Sung-Hak Cho verified the analytical methods. Kwangwoo Cho and Sung-Hak Cho encouraged Junha Choi to investigate the research and supervised the findings of this work. All authors discussed the results and contributed to the final manuscript.
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Choi, J., Cho, K. & Cho, SH. Ablation morphology and characteristic analysis of anisotropic conductive film (ACF) using femtosecond lasers with NIR, Green, and DUV wavelengths for micro-LED display repair. Appl. Phys. A 130, 140 (2024). https://doi.org/10.1007/s00339-024-07287-z
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DOI: https://doi.org/10.1007/s00339-024-07287-z