Abstract
In junctionless (JL) transistors, impurity scattering limits the carrier velocity within a channel, disturbing its performance in analog/RF applications. For the first time, the Si/Si0.5Ge0.5 heterostructures and asymmetric spacers are used in this paper to improve the figures of merit of analog/RF performance of a silicon-on-insulator JL transistor (SOI-JLT). The proposed device is called hybrid heterostructure-SOI-JLT (HH-SOI-JLT), in which regions with HfO2 are referred to as the high-κ spacer, whereas regions with SiO2 are known as the low-κ spacer. According to the simulation results, Si/Si0.5Ge0.5 heterostructure in the channel of the HH-SOI-JLT device caused an offset in the conduction band energy and created quantum well in the interfacial of drain/channel and enhanced electron velocity and density of electrons significantly. Moreover, using the high-κ spacer intensified the fringing fields in the region above the threshold, and using the low-κ spacer decreased the gate-to-drain capacitance. With a 20-nm channel, maximum transconductance (Gmmax), unity gain cut-off frequency (\(f_{T}\)), and intrinsic gain (AV) of the HH-SOI-JLT device are optimized by 265%, 83%, and 90%, respectively, compared to the same dimensional SOI-JLT device. In fact, the proposed HH-SOI-JLT device can be an appropriate candidate for analog/RF applications.
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Fallahnejad, M., Amini, A., Khodabakhsh, A. et al. High-speed SOI junctionless transistor based on hybrid heterostructure of Si/Si0.5Ge0.5 and asymmetric spacers with outstanding analog/RF parameters. Appl. Phys. A 128, 47 (2022). https://doi.org/10.1007/s00339-021-05153-w
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DOI: https://doi.org/10.1007/s00339-021-05153-w