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Solution-processable alumina: PVP nanocomposite dielectric layer for high-performance organic thin-film transistors

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Abstract

In this article, we have investigated the effect of nanocomposite gate dielectric layer built by alumina (Al2O3) and poly(4-vinyphenol) (PVP) with solution method which could enhance the dielectric capability and decrease the surface polarity. Then, we used modify layer to optimize the surface morphology of dielectric layer to further improve the insulation capability, and finally we fabricated the high-performance and low-voltage organic thin-film transistors by using this nanocomposite dielectric layer. The result shows that the devices with Al2O3:10%PVP dielectric layer with a modified layer exhibited a mobility of 0.49 cm2/Vs, Ion/Ioff ratio of 7.8 × 104, threshold voltage of − 1.2 V, sub-threshold swing of 0.3 V/dec, and operating voltage as low as − 4 V. The improvement of devices performance was owing to the good insulation capability, appropriate capacitance of dielectric layer, and preferable interface contact, smaller crystalline size of active layer.

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Authors and Affiliations

  1. University of Electronic Science and Technology of China, Chengdu, China

    Hui Lin, Xiao Kong, Yiran Li, Peng Kuang & Silu Tao

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  1. Hui Lin
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  2. Xiao Kong
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  3. Yiran Li
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  4. Peng Kuang
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  5. Silu Tao
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Correspondence to Hui Lin.

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Lin, H., Kong, X., Li, Y. et al. Solution-processable alumina: PVP nanocomposite dielectric layer for high-performance organic thin-film transistors. Appl. Phys. A 124, 243 (2018). https://doi.org/10.1007/s00339-017-1377-4

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