Advanced piezoelectric crystal Ca₃TaGa₃Si₂O₁₄: growth, crystal structure perfection, and acoustic properties

Abstract

A five-component crystal of the lanthanum–gallium silicate family Ca₃TaGa₃Si₂O₁₄ (CTGS) was grown by the Czochralski method. The CTGS crystal, like the langasite crystal (La₃Ga₅SiO₁₄, LGS), possesses unique temperature properties and the fewer number of the Ga atoms in the unit cell makes the density much lower and, consequently, increases the velocity of acoustic wave propagation. The unit-cell parameters were determined by the powder diffraction technique. The defects in the CTGS crystal structure were studied by X-ray topography, which enables the visualization of growth banding characteristics of crystals grown by the Czochralski method. Surface acoustic wave (SAW) propagation in the CTGS crystal was investigated by the high-resolution X-ray diffraction method on the BESSY II synchrotron radiation source. The velocities of propagation and power flow angles of SAWs in the Y- and X-cuts of the CTGS crystal were determined from the X-ray diffraction spectra.