Abstract
Six Al(1%wtSi)/Zr multilayers are deposited on Si substrates by using the direct-current magnetron sputtering system, and annealed from 100 °C to 500 °C temperature in a vacuum furnace for 1 h. To evaluate the thermal stability of Al(1%wtSi)/Zr multilayers, the multilayers were characterized by grazing incidence X-ray reflectance, X-ray diffraction, X-ray emission spectroscopy, and near-normal incident extreme ultraviolet (EUV) reflection. The symmetric and asymmetric interlayer models are used to present the interfacial structure before and after 300 °C. The Al(1%wtSi)/Zr multilayer annealed up to 200 °C maintains the initial symmetric multilayer structure, and keeps almost the similar EUV reflectivity as the nonannealed sample. From 300 °C, interdiffusion is much greater at the Zr/Al interface compared with the Al/Zr interface. And the interfacial phases of Al-Zr alloy transform from amorphous to polycrystalline, which induces the deterioration of multilayer structure and the decrease of EUV reflectivity. However, up to 500 °C, the polycrystalline Al-Zr compound does not destroy the multilayer completely.
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Acknowledgements
This work is supported by National Basic Research Program of China (No. 2011CB922203) and National Natural Science Foundation of China (Nos. 10825521, 11061130549).
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Zhong, Q., Zhang, Z., Zhu, J. et al. The thermal stability of Al(1%wtSi)/Zr EUV mirrors. Appl. Phys. A 109, 133–138 (2012). https://doi.org/10.1007/s00339-012-7085-1
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DOI: https://doi.org/10.1007/s00339-012-7085-1