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The effects of sodium in ITO by pulsed laser deposition on organic light-emitting diodes

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Abstract

The depth profile of ITO on glass was measured by the time-of-flight secondary ion mass spectroscopy (TOFSIMS) which revealed high sodium (Na) ion concentration at the ITO surface as well as at the ITO–glass interface as a result of out diffusion with substrate heating. Effects of Na ions on the performance of organic light-emitting diode (OLED) were studied by etching away a few tens of nanometers off the ITO surface with a dilute aquaregia solution of HNO3:HCl:H2O. A single-layer, molecularly doped ITO/(PVK+TPD+Alq3)/Al OLEDs were fabricated on bare and etched ITO samples. Although the removal of a 10-nm layer of ITO surface increased the voltage range, brightness, and lifetime, it was insufficient to correlate these improvements with solely to the Na ion reduction without considering the surface roughness.

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Author notes

  1. Thian-Khok Yong

    Present address: Faculty of Engineering and Science, Universiti Tunku Abdul Rahman, Kuala Lumpur, Malaysia

  2. Seong-Shan Yap

    Present address: Department of Physics, Norwegian University of Science and Technology, 7491, Trondheim, Norway

Authors and Affiliations

  1. Faculty of Engineering, Multimedia University, Cyberjaya, Selangor, Malaysia

    Thian-Khok Yong, Yeh-Yee Kee, Sek-Sean Tan, Seong-Shan Yap, Wee-Ong Siew & Teck-Yong Tou

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  1. Thian-Khok Yong
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  2. Yeh-Yee Kee
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  6. Teck-Yong Tou
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Correspondence to Teck-Yong Tou.

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Yong, TK., Kee, YY., Tan, SS. et al. The effects of sodium in ITO by pulsed laser deposition on organic light-emitting diodes. Appl. Phys. A 101, 621–626 (2010). https://doi.org/10.1007/s00339-010-5913-8

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  • DOI: https://doi.org/10.1007/s00339-010-5913-8

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