Abstract
High energy photoelectron spectroscopy (PES) is an essential tool to overcome the high surface sensitivity of the conventional photoelectron spectroscopy for the study of bulk electronic structures of strongly correlated electron systems, which often have many different electronic structures in the surface and the bulk. The potential of the soft X-ray ARPES (SX-ARPES) in the several hundred eV region for bulk Fermiology of such systems is first demonstrated. Higher bulk sensitivity is achieved by hard X-ray PES (HAXPES) beyond several keV. Deconvolution of the surface, subsurface and bulk is feasible by combining SX-PES and HAXPES spectra measured at several very different h ν. Recoil effects of photoelectrons are observed in HAXPES not only in core spectra but also in valence band spectra of some materials with light elements. The present status and future possibility of high energy PES are discussed.
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Suga, S. Potential and restriction of high resolution, high energy photoemission in 400–8,000 eV for studying strongly correlated electron systems. Appl. Phys. A 92, 479–485 (2008). https://doi.org/10.1007/s00339-008-4555-6
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DOI: https://doi.org/10.1007/s00339-008-4555-6