Abstract
Results from a growth and characterization study of PrFe4Sb12 thin films synthesized by pulsed laser deposition (PLD) are reported. Films were grown under a variety of conditions where substrate temperature, annealing schedule, and laser power were optimized to produce single phase material. Various substrates were used for film growth. X-ray diffraction data indicate that the films are primarily single phase with very small amounts of antimony inclusions. The high quality of the films is reflected in electrical resistivity vs temperature data which are consistent with previous results for bulk polycrystalline and single crystal specimens.
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71.27.+a; 73.50.-h; 81.15.Fg; 68.55.JK
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Baumbach, R., Yuhasz, W. & Maple, M. Pulsed laser deposition of PrFe4Sb12 thin films. Appl. Phys. A 84, 227–229 (2006). https://doi.org/10.1007/s00339-006-3607-z
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DOI: https://doi.org/10.1007/s00339-006-3607-z