A composite surface measurement probe, developed for the characterisation of engineering surfaces, is presented. The probe is of a hybrid type and is capable of contact and non-contact measurement, making it suitable for a wide range of applications. It integrates a focus-detection optical system with a stylus-mirror system. Calibration results show that the probe can measure dimensions larger than ±500 μm with good linearity for both contact and non-contact measurement. The vertical measurement resolution of the probe is 5 nm.
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Lu, S., Li, Z. A Composite Probe for Surface Topography Measurement. Int J Adv Manufa Technol 18, 831–835 (2001). https://doi.org/10.1007/s001700170008
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DOI: https://doi.org/10.1007/s001700170008