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A new multiple dependent state sampling plan based on one-sided process capability indices

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Abstract

Process capability indices (PCIs) are effective quality tools for evaluating process performance in the manufacturing industry. Over a period of more than 15 years, sampling plans based on PCIs have been developed for lot sentencing. Sampling plans that involve repetitive sampling or multiple dependent (deferred) state sampling achieve significant sample size reductions relative to sampling plans that involve single sampling. In this study, we combine the concepts of repetitive and multiple dependent state sampling to propose a new variable sampling plan based on one-sided PCIs. The proposed sampling plan minimizes the average sample number while satisfying the principle of two points on the operating characteristic curve. To demonstrate the performance of the proposed sampling plan, a comparison with existing homogeneous sampling plans is performed.

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Funding

This work was supported by Ministry of Science and Technology of Taiwan (Grant numbers MOST 111–2221-E-211–001).

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Professor Ching-Ho Yen contributed to the study conception and design. Material preparation, data collection and analysis were performed by Chia-Hao Chang and Chun-Chia Lee. The first draft of the manuscript was written by Ching-Ho Yen & Chia-Hao Chang and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.”

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Correspondence to Chia-Hao Chang.

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Yen, CH., Chang, CH. & Lee, CC. A new multiple dependent state sampling plan based on one-sided process capability indices. Int J Adv Manuf Technol 126, 3297–3309 (2023). https://doi.org/10.1007/s00170-023-11310-7

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  • DOI: https://doi.org/10.1007/s00170-023-11310-7

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