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‘MN1606SP’ by ‘Spencer’ filial soybean population reveals novel quantitative trait loci and interactions among loci conditioning SDS resistance

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Abstract

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Four novel QTL and interactions among QTL were identified in this research, using as a parent line the most SDS-resistant genotype within soybean cultivars of the US early maturity groups.

Abstract

Soybean sudden death syndrome (SDS) reduces soybean yield in most of the growing areas of the world. The causal agent of SDS, soilborne fungus Fusarium virguliforme (Fv), releases phytotoxins taken up by the plant to produce chlorosis and necrosis in the leaves. Planting resistant cultivars is the most successful management practice to control the disease. The objective of this study was to identify quantitative trait loci (QTL) associated with the resistance response of MN1606SP to SDS. A mapping population of F 2:3 lines created by crossing the highly resistant cultivar ‘MN1606SP’ and the susceptible cultivar ‘Spencer’ was phenotyped in the greenhouse at three different planting times, each with three replications. Plants were artificially inoculated using SDS infested sorghum homogeneously mixed with the soil. Data were collected on three disease criteria, foliar disease incidence (DI), foliar leaf scorch disease severity (DS), and root rot severity. Disease index (DX) was calculated as DI × DS. Ten QTL were identified for the different disease assessment criteria, three for DI, four for DX, and three for root rot severity. Three QTL identified for root rot severity and one QTL for disease incidence are considered novel, since no previous reports related to these QTL are available. Among QTL, two interactions were detected between four different QTL. The interactions suggest that resistance to SDS is not only dependent on additive gene effects. The novel QTL and the interactions observed in this study will be useful to soybean breeders for improvement of SDS resistance in soybean germplasm.

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Acknowledgements

This study was funded by grants from the Iowa Soybean Association (ISA), the North Central Soybean Research Program (NSCRP), and the United Soybean Board (USB). We thank Peter Lundeen, Gregory Gebhart, and Dr. Amilton Ferreira for their assistance with the experiments and DNA isolation. We also thank Dr. Perry Cregan and Dr. Qijian Song for their help running the Illumina Infinium BeadChip genotyping assay.

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Authors and Affiliations

  1. Department of Agronomy, Iowa State University, Ames, IA, 50011, USA

    Alexander S. Luckew, Sivakumar Swaminathan & Silvia R. Cianzio

  2. Department of Plant Pathology, Iowa State University, Ames, IA, 50011, USA

    Leonor F. Leandro

  3. Department Agronomy and Plant Genetics, University of Minnesota, St. Paul, MN, 55108, USA

    James H. Orf

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  1. Alexander S. Luckew
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  2. Sivakumar Swaminathan
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  3. Leonor F. Leandro
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  5. Silvia R. Cianzio
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Correspondence to Silvia R. Cianzio.

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Communicated by Brian Diers.

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Luckew, A.S., Swaminathan, S., Leandro, L.F. et al. ‘MN1606SP’ by ‘Spencer’ filial soybean population reveals novel quantitative trait loci and interactions among loci conditioning SDS resistance. Theor Appl Genet 130, 2139–2149 (2017). https://doi.org/10.1007/s00122-017-2947-8

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