Abstract
The electron-probe microanalyzer designed and built at the National Bureau of Standards is described. The functional design considerations involved are discussed, and the need for such an instrument in the metallurgical field is reviewed. Additional features and modifications of the NBS electron probe are described. Current developments in electron-probe instrumentation are also discussed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
H C. Sorby: Proc. Sheffield Lit. Phil. Soc. 1864; Feb. Brit. Assoc. Rep. 1864, vol. 11, no. 189.
Engineer; vol. 54, no. 308.
J. Iron Steel Inst.; vol. i, p. 140; vol. i, p. 255.
H. G. J. Mosley: Phil. Mag., vol. 26, p. 1024.
G. von Hevesy: Chemical Analysis by X-Rays and Its Application; McGraw-Hill Book Co. Inc., New York, 1932.
J. Hillier: US Patent 2,418,029; Oct. 8, 1943.
R. Castaing: thesis, Paris University, Paris, France, 1951.
R. Castaing: Electron Probe Microanalyzer and Its Application to Ferrous Metallurgy; Trans. AIME, vol. 209, p. 389.
L. Marton: US Patent 2,233,286; Feb. 25, 1941.
L. Birks and R. E. Seebold: private communication.
K. H. Steigerwald: Optik, vol. 5, pp. 469-47811/18/2017 3:19PM11/18/2017 3:19PM.
G. Liebmann and E. M. Grad: Proc. Physical Soc, vol. 648, pp. 956–977, London.
G. Liebmann: Proc. Physical Soc, vol. 68B, pp. 679–685, 737-745, London.
L. L. Wyman, J. R. Cuthill, G. A. Moore, J. J. Park, and H. Yakowitz: Intermediate Phases in Superconducting Columbium-Tin Alloys; J. Research, NBS, vol. 66A, pp. 351-363.
H. H. Pattee: X-Ray Microscopy and Microradiography; Academic Press, New York, 1957, pp. 367–373.
P. Duncomb and V. E. Cosslett: X-Ray Microscopy and Microradiography; Academic Press, New York, 1957, pp. 374–380.
L. S. Birks: Calculation of X-Ray Intensities from Electron Probe Specimen; J. Appl. Phys., vol. 32, pp. 287-391.
L. S. Birks: Electron Probe Intensity Calculations for 20-50 kev Electrons; J. Appl. Phys., vol. 33, p. 233.
R. Castaing and J. Descamps: The Physical Principles of Spot Analysis by X-Ray Spectroscopy; Trans. No. 899, S. L. A. Translation Center, John Crerar Library, Chicago, 1951.
J. Philibert: The Castaing Microsonde in Metallurgical and Mineralogical Research; J. Inst, of Metals, vol. 90, pp. 241-252.
J. Philibert: A Method to Calculate the Absorbtion Correction in Electron Probe Microanalysis; Paper no. 40, Third International Symposium on X-Ray Optics and X-Ray Microanalysis, Stanford University, Aug. 22-24, 1962.
D. M. Poole and P. M. Thomas: Quantitative Electron Probe Analysis; J. Inst, of Metals, vol. 90, pp. 228-233.
H. Yakowitz and J. R. Cuthill: A Survey of Correction Procedures for Electron Probe Microanalysis Data; unpublished.
D. B. Wittry: Fluorescence by Characteristic Radiation in Electron Probe Microanalysis: USCEC Report 84-204, July 1962.
P. Duncomb and P. K. Shields: Calculation of Fluorescence Excited by Characteristic Radiation in the X-Ray Microanalyzer; Paper no. 37, Third International Symposium on X-Ray Optics and X-Ray Microanalysis, Stanford University, Aug. 22-24, 1962.
Henoc: thesis, University of Paris, France, 1962.
P. Duncomb: An Electron Optical Bench for Microscopy, Diffraction and X-Ray Microanalysis; Fifth International Congress for Electron Microscopy, vol. 1, Sydney S. Breese, Jr. (ed.), Academic Press, New York, 1962.
R. M. Dolby: An X-Ray Microanalyzer for Elements of Low Atomic Number; Paper no. 51, Third International Symposium on X-Ray Optics and X-Ray Microanalysis, Stanford University, Aug. 22-24, 1962.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Cuthill, J.R., Wyman, L.L. & Yakowitz, H. Metallurgical Microanalysis with the Electron Probe. JOM 15, 763–768 (1963). https://doi.org/10.1007/BF03397249
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF03397249