Abstract
The rate of growth of a single grain growing into a strained aluminum single crystal, measured by the conventional heat-cool-etch technique, is shown to decrease with time at temperature. The growth rate measured by means of X-rays, with the sample continuously at temperature, is found to be linear. Evidence is presented to show that the decreasing growth rate obtained by the conventional technique is due to abnormal recovery in the strained grain, and that the recovery in turn results from the heating and cooling, cycles, rather than from the effects of etching. The experimental apparatus is described in an appendix.
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C. D. GRAHAM, Jr., Junior Member AIME, formely Research Student, Dept. of Physical Metallurgy, University of Birmingham
TP 4061E. Manuscript, Apr. 1, 1955. Philadelphia Meeting, October 1955.
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Graham, C.D., Cahn, R.W. Measurement of Grain Growth Rates in Recrystallization. JOM 8, 504–508 (1956). https://doi.org/10.1007/BF03377713
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DOI: https://doi.org/10.1007/BF03377713