Abstract
This paper describes the conceptual basis for the systems design and new equipment integration at Lawrence Berkeley Laboratory’s National Center for Electron Microscopy. Computer aided image processing helps scientists develop better structural models which, in turn, help define new directions for improved image processing. Several examples are cited to demonstrate how improvements in experimental techniques, high voltage, high resolution and microanalytical capabilities, combined with computer processing impact on materials characterization.
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D.A. Ackland, U. Dahmen, C.J. Echer, R. Kilaas, K.M. Krishnan, C. Nelson, M.A. O’Keefe, W. Smith and J. Turner are currently with the National Center for Electron Microscopy at the Lawrence Berkeley Laboratory of the University of California.
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Ackland, D.A., Dahmen, U., Echer, C.J. et al. Recent TEM Applications. JOM 38, 19–24 (1986). https://doi.org/10.1007/BF03258575
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DOI: https://doi.org/10.1007/BF03258575