Abstract
This paper, adapted from a presentation in the joint TMS-SME symposium at the 1985 AIME Annual Meeting in New York, discusses the importance of mineralogical and chemical characterization of fine particles in mineral and metallurgical processing. The correct choice of instrument depending on particle size, composition, and nature of sample is stressed; and the analytical capabilities of different types of instruments are evaluated. Applications of electron beam equipment for surface analysis are mentioned and the paper concludes with a review of some recent work performed in the processing field.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
R.E. Boorman, W. Petruk, and R. Gilders, “Silver Carriers in Concentrate and Tailings from Brunswick Mining and Smelting Corporation Limited,” Process Mineralogy III, SME-AIME, Golden, Colorado, 1984, pp. 33–50.
R. Castaing, “Application des Sondes Electroniques a une Methode d’Analyse Ponctuelle Chimique et Crystallographique,” Ph.D. Thesis, Universite de Paris, 1951, p. 140.
G. Cliff and G.W. Lorimer, “The Quantitative Analysis of Thin Specimens,” J. Microsc., 103, (1975), pp. 203–207.
V.E. Coslett and P. Duncumb, “Microanalysis by a Flying Spot X-ray Method,” Nature, (London), 177, (1956), pp. 1172–1173.
R. Espinoza-Gomez, N. Rowlands, and J.A. Finch, “Mineralogical Examination in Evaluating Magnetic Separation of Residues from the Sulphation Roast-Leach Process for Complex Sulphides,” Process Mineralogy III, SME-AIME, Golden, Colorado, 1984, pp. 247–256.
S.T. Hall, J.A. Finch, and N. Rowlands, “The Enhancement of the Magnetic Susceptibility of Pyrite by Oxidative Pressure Leaching,” Trans. I.M.M., London (in press).
G.S. Hill, N. Rowlands, and J.A. Finch, “Correlation Between Color and Iron Content in Pure Point Sphalerites,” Economic Geology, March, 1985..
J. Hillier, 1947, U.S. Patent 2,418,029.
M.P. Jones, “Designing an X-ray Image Analyzer for Measuring Mineralogical Data,” XIV International Mineral Processing Congress, Session VIII, Paper 4. CIMM, 1982.
L.L. Marton, 1941, U.S. Patent 2,233,286.
P.R. Miller, A.F. Reid, and M.A. Zuiderwyk, “QEM-SEM Image Analysis in the Determination of Modal Assays, Mineral Associations and Mineral Liberation,” XIV International Mineral Processing Congress, Session VIII, Paper 3, CIMM, 1982.
F.D. Pooley, “The Use of an Analytical Electron Microscope in the Analysis of Mineral Dusts,” Phil. Trans. R. Soc. Lond. A, 286, (1977), pp. 673–690.
G. Remond, P.H. Hollbway, and C. Le Gressus, “Electron Spectroscopy and Microscopy for Studying Surface Changes of Mechanically Prepared Pyrite and Quartz,” Scanning Electron Microsc. 1981, II, pp. 483–493.
Additional information
Neil Rowlands received his Ph.D. in mining engineering from the University of Wales in 1977. He is currently Assistant Professor in the Mining and Metallurgical Engineering Department of McGill University, Quebec, Canada.
Rights and permissions
About this article
Cite this article
Rowlands, N. Electron Beam Techniques for the Analysis of Fine Particles in the Minerals Industry. JOM 37, 16–19 (1985). https://doi.org/10.1007/BF03257702
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF03257702