Abstract
We investigate numerically the transmission properties of a thin sinusoidally corrugated metal film bounded by two different dielectrics in the context of the experiment of Gruhlkeet al (1986). We study the dominant contributions from both the propagating and evanescent plane waves. A comparison with the experimental results reveals that the decisive role in cross coupling is played by the evanescent waves emitted by the molecular dipole. We extend our studies to different corrugation amplitudes and widths to show their effect on transmission.
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Pande, M.B., Gupta, S.D. A theoretical study of surface plasmon cross coupling in asymmetric corrugated metal films. Pramana - J Phys 34, 575–583 (1990). https://doi.org/10.1007/BF02846434
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DOI: https://doi.org/10.1007/BF02846434