Abstract
The fourth central moment of an X-ray diffraction profile from an aggregate of distorted crystallites has been expressed by Mitra (1964a) as a function of the crystallite size, strain and strain gradients in the specimen. While the usual methods of line profile analysis yield information regarding either the apparent strain or the rms strain, the present study provides additional information regarding strain distribution in the form of strain derivatives and rms displacements of atoms over a given distancet in the direction of study. The strain parameters like 〈ee′〉, 〈ee″〉 have been obtained from fourth moment of the strain profile against range plots. The strain parameters thus obtained have subsequently been used to determine the rms displacements of the atoms. Alloys of copper and zinc at different stages of cold working and annealing have been studied by this method. The results have been discussed in the light of dislocation distribution, polygonisation and grain growth as well as distortion waves in the distorted crystals.
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References
Ashby M F 1969Physics of strength and plasticity (ed) A S Argon (Cambridge: MIT Press) p. 113
Borie B S 1956Acta Crystallogr. 9 617
Chipman D R and Paskin A 1959J. Appl. Phys. 30 1992
De A K and Bhattacharjee S 1985Clay Minerals 20 249
Edwards H J and Toman K 1971J. Appl. Crystallogr. 4 319
Kulshrestha A K, Dweltz N F and Radhakrishnan T 1971J. Appl. Crystallogr. 4 116
Mitra G B 1964aBrit. J. Appl. Phys. 15 917
Mitra G B 1964bActa Crystallogr. 17 765
Mitra G B and Misra N K 1966Brit. J. Appl. Phys. 17 1319
Mitra G B and Chattopadhyay T 1972Phys. Status Solidi 9 89
Mitra G B and Chattopadhyay T 1975Indian J. Phys. 49 218
Mitra G B and Chaudhuri A K 1974J. Appl. Crystallogr. 7 350
Mitra G B and Mukherjee P S 1981J. Appl. Crystallogr. 14 421
Mittemeijer E J and Delhez R 1979Proc. of symp. on accuracy in power diffraction held at NBS, Gaithersburg MD, June 11–15; p. 271
Warren B E 1955Acta Crystallogr. 6 803
Wilson A J C 1962Proc. Phys. Soc. 80 286
Wilson A J C 1963Mathematical theory of X-ray powder diffractometry, Philips Technical Library Eindhoven, The Netherlands p. 62
Wilson A J C 1969Acta Crystallogr. A25 515
Wilson A J C 1965Proc. Phys. Soc. 85 807
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Mitra, G.B., Ghosh, T.B. New studies of X-ray diffraction line profiles from aggregates of distorted crystallites I. Pramana - J Phys 29, 285–301 (1987). https://doi.org/10.1007/BF02845736
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DOI: https://doi.org/10.1007/BF02845736