Abstract
Epitaxial thin film PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures have been grown on single crystal LaA103 by in-situ pulsed laser deposition. Structural characterization by x-ray diffraction, and transmission electron microscopy reveals that the films are typically c-axis oriented with a small fraction of a-axis oriented material, that is deposition condition dependent. The electrical properties change systematically with the crystalline quality and the best properties are obtained at higher temperatures. Above 715‡ C, there is progressive loss of lead and the electrical properties are diminished.
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See for example, Proc. of Mater. Res. Soc. Spring Mtg. Symp. “Ferroelectric Thin Films,≓ eds. E. R. Myers and A. Kingon, Mater. Res. Soc, Pittsburgh, PA, April 1990.
Proc. of Third Int. Symp. on Integrated Ferroelectrics, Col- orado Springs, CO, April 1991.
J. F. Scott and C. A. Paz de Araujo, Science246, 1400 (1989).
M. Sayer and K. Sreenivas, Science247, 1056 (1990).
S. K. Dey, K. D. Budd and D. A. Payne, IEEE Trans. Ultra- sonics, Ferroelectrics and Frequency Control,35, 80 (1988); see also papers in Refs. 1, 2; R. W. Vest and J. Xu, Ferro- electrics93, 21 (1989).
Y. Sakashita, T. Ono, H. Segawa, K. Tominaga and M. Okada, J. Appl. Phys.69, 8352 (1991).
K. Iijima, R. Takayama, Y. Tomita and I. Ueda, J. Appl. Phys.60, 2914 (1986).
H. Buhay, S. Sinharoy, W. H. Kasner, M. H. Francombe, D.R. Lampe and E. Stepke, Appl. Phys. Lett.58, 1470 (1991).
A. I. Kingon, O. Auciello, M. S. Ameen, S. H. Rou and A.R. Krauss, Appl. Phys. Lett.55, 301 (1989).
R. Ramesh, A. Inam, B. Wilkens, W. K. Chan, D. L. Hart, K. Luther and J. M. Tarascon, Science252, 944 (1991).
A. Inamet al., Appl. Phys. Lett.53, 908 (1988).
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Ramesh, R., Chan, W.K., Wilkens, B. et al. Structure and properties of ferroelectric PbZr0.2Ti0.8O3/YBa2Cu3O7 heterostructures. J. Electron. Mater. 21, 513–518 (1992). https://doi.org/10.1007/BF02655618
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DOI: https://doi.org/10.1007/BF02655618