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An analysis of concentration profiles for fluxes, diffusion depths, and zero-flux planes in multicomponent diffusion

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Abstract

Concentration profiles developed during isothermal, multicomponent diffusion for a single-phase, solid-solid diffusion couple are expressed on the basis of a relative concentration variable for each component and analyzed for the determination of interdiffusion fluxes. The individual concentration profiles intersect at a common cross-over composition where the relative concentrations of all components are identical. New relations are developed for describing internal consistency among the concentration profiles of the various components. A link is made between the cross-over composition and the depths of the diffusion zone on either side of the Matano plane for a diffusion couple. The cross-over composition is interpreted as the average relative concentration of each component over the diffusion zone. The identification of a zero-flux plane from concentration profiles is also described. The analysis offers several advantages in presenting as well as checking the self-consistency of results as illustrated with a single phase Cu-Ni-Zn diffusion couple annealed at 775 °C.

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Dayananda, M.A. An analysis of concentration profiles for fluxes, diffusion depths, and zero-flux planes in multicomponent diffusion. Metall Trans A 14, 1851–1858 (1983). https://doi.org/10.1007/BF02645555

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