Abstract
We present the elements of a theory for computer aided measurement systems with superhigh resolution. We present the concept of an ideal measurement instrument that does not distort the parameters of an object of study.
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Translated from Izmeritel'naya Tekhnika, No. 2, pp. 3–10, February, 1998.
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Pyt'ev, Y.P., Chulichkov, A.I. Foundations for a theory of computer assisted superhigh resolution measurement systems. Meas Tech 41, 111–121 (1998). https://doi.org/10.1007/BF02524537
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DOI: https://doi.org/10.1007/BF02524537