Abstract
A 1.8 MeV He-beam from a Van de Graaff accelerator has been used to demonstrate that back-scattering techniques can be usefully applied to study certain problems related to the interaction between coatings and paper substrates and between printing inks and coated or uncoated paper or plastic substrates. In particular, information on distribution profiles of various components can be obtained. The technique and some of its practical aspects are briefly described.
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References
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Eriksson, L., Fladda, G. & Johansson, P.Å. The use of alpha particle back-scattering for the study of printed and coated layers. J. Radioanal. Chem. 12, 287–300 (1972). https://doi.org/10.1007/BF02520996
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DOI: https://doi.org/10.1007/BF02520996