Abstract
The problem of spectrochemical analysis of elements in solutions has been investigated for a number of elements across the periodic table using radioisotope-induced energy dispersive X-ray fluorescence method. In this study a low intensity109Cd X-ray source was used for characteristic X-ray excitation. Experimental parameters such as saturation thickness and critical thickness have been studied to evaluate their role in this method. Minimum detection limits, sensitivities and the nature of concentration calibration at critical thickness have been obtained as a function of Z to find the limits of the method. Results obtained have been discussed in the light of theories and potential areas of applicability of the method have been indicated.
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Kalam, M.A., Hussam, A., Khaliquzzaman, M. et al. Elemental analysis in solutions by radioisotope excited X-ray fluorescence. J. Radioanal. Chem. 46, 285–297 (1978). https://doi.org/10.1007/BF02519895
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DOI: https://doi.org/10.1007/BF02519895