Skip to main content
Log in

Measurement of dielectric properties of high-absorption materials at microwave frequencies

  • Radioengineering Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

A method is proposed for measuring the dielectric constant ε′ and dielectric loss ε″ of high-absorption dielectric materials by measuring the reflection of electromagnetic radiation with the aid of an adjustable quarter-wave matching plate of nonabsorbing material close to the dielectric surface.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. A. F. Harvey,Microwave Engineering [Russian translation], Sov. Radio, Moscow (1965), Vol. 1.

    MATH  Google Scholar 

  2. R. M. Kasimov,Metrologiya, No. 7, 45 (1987).

    Google Scholar 

  3. Ch. O. Kadzhar, É. R. Kasimov, and G. N. Nasibov,Izmer. Tekh., No. 2, 46 (1996).

    Google Scholar 

Download references

Authors

Additional information

Translated from Izmeritel'naya Tekhnika, No. 5, pp. 45–47, May, 1999.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kasimov, É.R., Sadykhov, M.A., Kasimov, R.M. et al. Measurement of dielectric properties of high-absorption materials at microwave frequencies. Meas Tech 42, 475–478 (1999). https://doi.org/10.1007/BF02504472

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02504472

Keywords

Navigation