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Electromagnetic Metrology for Microwave Absorbing Materials

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Handbook of Metrology and Applications

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Abstract

In recent times, microwave absorbing materials have been playing crucial roles in various applications including communication, stealth, and shielding. The working of these materials largely depends on the careful characterizations that include measurement for morphological, electrical, and physical properties followed by microwave characterization. A significant amount of work has been carried out in exploring the physical, electrical, and magnetic properties of various organic and inorganic materials, polymers, nanocomposites, meta-surfaces, and metamaterials suitable for employing them as microwave absorbing material. Both intrinsic and extrinsic properties of materials play an important role in the development of microwave absorbing materials. The design of the functional materials largely depends on the optimization of the intrinsic properties of the raw material such that required extrinsic properties can be achieved. Depending on the application, a wide range of such parameters need to be characterized to test the performance of the material in a particular frequency range. An excellent microwave absorbing material is required to possess main properties like high reflection loss, wide bandwidth, low weight, lower coating thickness, chemically inactive, and cost-effectiveness. To measure these properties, the microwave characterizations can be difficult to implement in various scenarios such as when (1) operating in wideband frequency range; (2) size, shape, and thickness of the material are not uniform; (3) the sample of material is in difficult state for microwave characterization, i.e., semisolid or liquid; (4) there is an unavailability of the specific complex instrument or software; and (5) using novel materials with poor repeatability. All these factors contribute to the uncertainty in the measurement of performance parameters of microwave absorbing materials. In this chapter, the relationship of fundamental aspects of electromagnetic (EM) materials with the performance of the microwave absorption is presented. Indicative literature is presented showing the major sources of uncertainty and their contribution in the measurement. Various applications are discussed where characterization of this relationship becomes a key factor.

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Authors and Affiliations

  1. Department of Computer Science and Engineering, GITAM Deemed to be University, Visakhapatnam, India

    Naina Narang

  2. Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India

    Anshika Verma, Jaydeep Singh & Dharmendra Singh

Authors
  1. Naina Narang
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  2. Anshika Verma
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  3. Jaydeep Singh
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  4. Dharmendra Singh
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Corresponding author

Correspondence to Dharmendra Singh .

Editor information

Editors and Affiliations

  1. Bhabha Atomic Research Centre, Mumbai, Maharashtra, India

    Dinesh K. Aswal

  2. Physico-Mechanical Metrology, CSIR - National Physical Laboratory, New Delhi, Delhi, India

    Sanjay Yadav

  3. National Metrology Institute of Japan, National Institute of Advanced Industria, Ibaraki, Japan

    Toshiyuki Takatsuji

  4. National Institute of Standards and Tech, GAITHERSBURG, MD, USA

    Prem Rachakonda

  5. Mechanical Engineering Department, National Institute of Technology, Delhi, India

    Harish Kumar

Section Editor information

  1. CSIR-National Physical Laboratory, New Delhi, India

    S. K Dubey PhD

  2. CSIR-National Physical Laboratory, New Delhi, India

    D. K Aswal PhD

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Narang, N., Verma, A., Singh, J., Singh, D. (2023). Electromagnetic Metrology for Microwave Absorbing Materials. In: Aswal, D.K., Yadav, S., Takatsuji, T., Rachakonda, P., Kumar, H. (eds) Handbook of Metrology and Applications. Springer, Singapore. https://doi.org/10.1007/978-981-19-1550-5_80-1

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  • DOI: https://doi.org/10.1007/978-981-19-1550-5_80-1

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  • Print ISBN: 978-981-19-1550-5

  • Online ISBN: 978-981-19-1550-5

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