Abstract
The Linnik tomographic (sectional X-ray diffraction analysis) microscope for measurement of the spatial distribution of the index of refraction within optically transparent (phase) objects is described. The microscope is constructed on the base of the MII-4 microinterferometer with a laser lighting source and constitutes a fully automated integrated system that incorporates a CCD camera, frame grabber, a computer-controlled PZT mirror, and a two-coordinate micrometer stage. The measurement system and performance characteristics of the microscope are presented.
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Translated from Izmeritel'naya Tekhnika, No. 10, pp. 18–22, October, 1998.
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Vishnyakov, G.N., Levin, G.G. Linnik tomographic microscope for investigation of optically transparent objects. Meas Tech 41, 906–911 (1998). https://doi.org/10.1007/BF02503961
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DOI: https://doi.org/10.1007/BF02503961