Abstract
A novel method of Josephson junction formation using atomic force microscopy (AFM) is presented. We have investigated surface modifications of YBaCuO films by using AFM with applied voltages. Ridge structures have been observed at the surface of YBaCuO at applied voltages between 4V and 10V, the narrowest ridge line width fabricated being 150nm. The mechanism of the formation of the ridge structure is discussed. Current-voltage characteristics of AFM modified microbridges in YBaCuO thin films have been measured and analyzed.
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