Skip to main content
SpringerLink
Log in

Electronic transport in RuO2-based thick film resistors at low temperatures

  • Articles
  • Published:
Journal of Low Temperature Physics Aims and scope Submit manuscript

Abstract

The electrical conductivity of various RuO2-based thick film paste resistors was investigated in the temperature range between 50 mK and 20K. It is shown that models based on variable range hopping and simple models based on tunnelling of charge carriers between conductive grains do not provide a satisfactory explanation for the temperature dependence of the electrical conductivity in these materials at very low temperatures. We suggest a new mechanism based on tunnelling of electrons through graded barriers between conductive particles.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. S. Vasudevan and R. W. Vest,Proc. Int. Symp. Hybrid Microelectr., Baltimore 1989, p. 180; R. W. Vest and S. B. Lee,Proc. 6th Int. Microelectr. Conf., Tokyo (1990), p. 83.

  2. N. Niciloso, A. LeCorre-Frisch, J. Maier, and R. J. Brook,Solid State Ionics 75, 211 (1995).

    Article  Google Scholar 

  3. T. Yamaguchi and Y. Nakamura,J. Am. Ceram. Soc. 78, 1372 (1995).

    Article  ADS  Google Scholar 

  4. K. Bobran, A. Kusy, A. W. Stadler, and G. Wilezynski,Int. J. Electronics 78, 113 (1995).

    Google Scholar 

  5. J. Soundée, G. Chardin, Y. Girauld-Héraud, P Pari, and M. Chapellier,J. Low Temp. Phys. 93, 319 (1993).

    Article  Google Scholar 

  6. R. W. Willekers, F. Mathu, H. C. Meijer, and H. Postma,Cryogenics 30, 351 (1990).

    Article  Google Scholar 

  7. Ya. E. Volokitin, R. C. Thiel, and L. J. de Jongh,Cryogenics 34, 771 (1994).

    Article  Google Scholar 

  8. I. Baťko, K. Flachbart, M. Somora, and D. Vanický,Cryogenics 35, 105 (1995).

    Article  Google Scholar 

  9. F. Forlani and M. Prudenziati,Electrocomp. Sci. Technol. 3 77 (1976).

    Google Scholar 

  10. G. E. Pike and C. H. Seager,J. Appl. Phys. 48, 5152 (1977).

    Article  ADS  Google Scholar 

  11. W. Schoepe,Physica B 165–166, 299 (1990).

    Google Scholar 

  12. B. I. Shklovskii and A. L. Efros,Electronic Properties of Doped Semiconductors, Springer-Verlag, Berlin (1984); A. W. Ionov and I. S. Shlimak, inHopping Transport in Solids, M. Pollak and B. Shklovskii (eds.), Elsevier Sci. Publ. B.V., Amsterdam (1991), p. 397.

    Google Scholar 

  13. O. Entin-Wohlman, Y. Gefen, and Y. Shapira,J. Phys. C: Solid State Phys. 16, 1161 (1983).

    Article  ADS  Google Scholar 

  14. C. J. Adkins, inThe Metal—Nonmetal Transition Revisited, P. P. Edwards and C. N. Rao (eds.), Taylor and Francis, London (1995) p. 121.

    Google Scholar 

  15. C. J. Adkins,J. Phys.: Condens. Matter. 1, 1253 (1989).

    Article  ADS  Google Scholar 

  16. P. Sheng, E. K. Sichel, and J. I. Gittleman,Phys. Rev. Lett. 40, 1197 (1978).

    Article  ADS  Google Scholar 

  17. M. W. Meisel, G. R. Stewart, and E. D. Adams,Cryogenics 29, 1169 (1989).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute of Experimental Physics, Watsonova 47, SK-04353, Košice, Slovakia

    J. Roman, V. Pavlík & K. Flachbart

  2. Cavendish Laboratory, Madingley Road, CB3 0HE, Cambridge, UK

    C. J. Adkins

  3. Universität Bayreuth, D-95440, Bayreuth, Germany

    J. Leib

Authors
  1. J. Roman
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. Pavlík
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. K. Flachbart
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. C. J. Adkins
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. J. Leib
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Roman, J., Pavlík, V., Flachbart, K. et al. Electronic transport in RuO2-based thick film resistors at low temperatures. J Low Temp Phys 108, 373–382 (1997). https://doi.org/10.1007/BF02397680

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02397680

Keywords

Search

Navigation