Cems studies in iron-silicon thin films
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Conversion electron Mössbauer spectra (CEMS) of Fe1−xSi x /Si compositionally modulated thin films have been collected at room temperature. Evaluation of the hyperfine field distribution has been performed using a binomial distribution. A clear increase of the transition temperature as a function of the modulation length of the samples is observed. By means of the analysis of the hyperfine field distributions, an evaluation of the interfacial extension of the multi-lattices can be obtained.
KeywordsThin Film Transition Temperature Binomial Distribution Field Distribution Hyperfine Field
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