Hyperfine Interactions

, Volume 52, Issue 4, pp 321–327 | Cite as

Cems studies in iron-silicon thin films

  • B. Martínez
  • A. Labarta
  • J. Tejada


Conversion electron Mössbauer spectra (CEMS) of Fe1−xSi x /Si compositionally modulated thin films have been collected at room temperature. Evaluation of the hyperfine field distribution has been performed using a binomial distribution. A clear increase of the transition temperature as a function of the modulation length of the samples is observed. By means of the analysis of the hyperfine field distributions, an evaluation of the interfacial extension of the multi-lattices can be obtained.


Thin Film Transition Temperature Binomial Distribution Field Distribution Hyperfine Field 


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Copyright information

© Scientific Publishing Company 1989

Authors and Affiliations

  • B. Martínez
    • 1
  • A. Labarta
    • 2
  • J. Tejada
    • 2
  1. 1.ICMAB-C.S.I.C. Mati i Franques S/NBarcelonaSpain
  2. 2.Facultad de FísicaUniversidad de BarcelonaBarcelonaSpain

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