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Hyperfine Interactions

, Volume 52, Issue 4, pp 321–327 | Cite as

Cems studies in iron-silicon thin films

  • B. Martínez
  • A. Labarta
  • J. Tejada
Article

Abstract

Conversion electron Mössbauer spectra (CEMS) of Fe1−xSi x /Si compositionally modulated thin films have been collected at room temperature. Evaluation of the hyperfine field distribution has been performed using a binomial distribution. A clear increase of the transition temperature as a function of the modulation length of the samples is observed. By means of the analysis of the hyperfine field distributions, an evaluation of the interfacial extension of the multi-lattices can be obtained.

Keywords

Thin Film Transition Temperature Binomial Distribution Field Distribution Hyperfine Field 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    N.K. Jaggi, L.H. Schwartz, H.K. Wong and J.B. Ketterson, J. Magn. Magn. Mater. 49 (1985)1.CrossRefADSGoogle Scholar
  2. [2]
    H.M. Van Noort, F.J.A. den Broeder and H.J.D. Draaisma, J. Magn. Magn. Mater. 15–18 (1980)273.Google Scholar
  3. [3]
    C.N. Afonso, A.N. Lagunas, F. Briones and S. Girón, J. Magn. Magn. Mater. 62(1980) 833.CrossRefADSGoogle Scholar
  4. [4]
    J.M. Alameda, M.C. Contreras, M. Torres and A. Gonzalez Arche, J. Magn. Magn. Mater. 62 (1986)215.CrossRefADSGoogle Scholar
  5. [5]
    B. Martínez, M.A. Moreu, A. Labarta, X. Obradors and J. Tejada, J. Appl. Phys. 63(8)(1988)3206.CrossRefADSGoogle Scholar
  6. [6]
    T.E. Sharon and C.C. Tsuei, Phys. Rev. B5(1972)1047.CrossRefADSGoogle Scholar
  7. [7]
    G. LeCaër and J.M. Dubois, J. Phys. E12(1979)1083.CrossRefADSGoogle Scholar
  8. [8]
    I. Vincze, Solid State Commun. 25(1978)689.CrossRefMathSciNetGoogle Scholar
  9. [9]
    G. LeVaër, J.M. Dubois, U. Fischer, U. Gonser and H.G. Wagner, Nucl. Instr. Meth. B5(1984)25.CrossRefADSGoogle Scholar
  10. [10]
    J.M.D. Coey, D.H. Ryan and Yu Boliang, J. Appl. Phys. 55(1984)1800.CrossRefADSGoogle Scholar
  11. [11]
    A.M. Van der Kraan and K.H.J. Buschow, IEEE Trans. on Mag. MAG-20, 5(1984)1284.CrossRefGoogle Scholar
  12. [12]
    A.R. Miedema and F. Van der Woude, Physica 100B(1980)145.Google Scholar
  13. [13]
    J. Kwo, E.M. Gyorgy, D.B. McWhan, M. Hong, F.J. Disalvo, C. Vetier and J.E. Bower, Phys. Rev. Lett. 55(1985)402.CrossRefADSGoogle Scholar
  14. [14]
    N.S. Kazama and H. Fujimori,Proc. of Thin Films Conf., Asilomar, CA, USA (1985).Google Scholar
  15. [15]
    D. Liljequist, Scanin Electron Microscopy III(1983)997.Google Scholar

Copyright information

© Scientific Publishing Company 1989

Authors and Affiliations

  • B. Martínez
    • 1
  • A. Labarta
    • 2
  • J. Tejada
    • 2
  1. 1.ICMAB-C.S.I.C. Mati i Franques S/NBarcelonaSpain
  2. 2.Facultad de FísicaUniversidad de BarcelonaBarcelonaSpain

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