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Cems studies in iron-silicon thin films

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Abstract

Conversion electron Mössbauer spectra (CEMS) of Fe1−x Si x /Si compositionally modulated thin films have been collected at room temperature. Evaluation of the hyperfine field distribution has been performed using a binomial distribution. A clear increase of the transition temperature as a function of the modulation length of the samples is observed. By means of the analysis of the hyperfine field distributions, an evaluation of the interfacial extension of the multi-lattices can be obtained.

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Authors and Affiliations

  1. ICMAB-C.S.I.C. Mati i Franques S/N, 08028, Barcelona, Spain

    B. Martínez

  2. Facultad de Física, Universidad de Barcelona, Diagonal 647, 08028, Barcelona, Spain

    A. Labarta & J. Tejada

Authors
  1. B. Martínez
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  2. A. Labarta
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  3. J. Tejada
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Martínez, B., Labarta, A. & Tejada, J. Cems studies in iron-silicon thin films. Hyperfine Interact 52, 321–327 (1990). https://doi.org/10.1007/BF02395654

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  • DOI: https://doi.org/10.1007/BF02395654

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