Abstract
The feasibility of improving the accuracy of measurement of the angle of rotation of the polarization plane in the application of diffraction methods is investigated.
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References
B. I. Vasil'ev, Optics of Polarization Instruments [in Russian], Mashinostroenie, Moscow (1969).
L. A. Novitskii et al., Optoelectronic Devices for Scientific Research [in Russian], Mashinostroenie, Moscow (1986).
A. A. Shishlovvkii, Applied Physical Optics [in Russian], Fizmatgiz, Moscow (1961).
R. M. A. Azzam and N. B. Bashra, Ellipsometry and Polarized Light, North-Holland Publ. Co., Amsterdam; Elsevier North-Holland, New York (1977).
A. Gerrard and J. M. Burch, Introduction to Matrix Methods in Optics, Wiley, New York (1975).
W. A. Shurcliff, Polarized Light: Production and Use, Harvard Univ. Press, Cambridge, Mass. (1962).
Handbook for the Designer of Optomechanical Instruments [in Russian], Mashinostroenie, Leningrad (1980).
A. V. Rzhanov (ed.), Fundamentals of Ellipsometry [in Russian], Nauka, Novosibirsk (1979).
Sh. D. Kakichashvili, Polarization Holography [in Russian], Nauka, Leningrad (1989).
Sh. D. Kakichashvili and I. D. Shatalin, Pis'ma Zh. Tekh. Fiz.,12, No. 5, 277 (1986).
I. D. Shatalin, V. I. Kakichashvili, and Sh. D. Kakichashvili, Pis'ma Zh. Tekh. Fiz.,13, No. 17, 1051 (1987).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 4, pp. 32–34, April, 1996.
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Shatalin, I.D., Chkheidze, M.V., Ivanov, T.N. et al. Improving the accuracy of measurements of rotation of the plane of polarization. Meas Tech 39, 393–398 (1996). https://doi.org/10.1007/BF02374540
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DOI: https://doi.org/10.1007/BF02374540