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Problems in Polarization Metrology

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Abstract

Polarization metrology is gaining increased importance as polarized light is recently involved in different branches of science and technology. This paper summarizes the contributions of the optical polarization laboratory at the National Institute for standards (NIS, Egypt) during the last 25 years. These include introducing a new class of total internal reflection phase retarders, modifying the Senarmont method to allow for simultaneous calibration of two phase plates at any wavelength, birefringence measurements, applications of the Poincaré sphere, calibration and adjustment of polarization elements and measurements of the optical constants of conductors.

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References

  1. N.N. Nagib and M.S. El-Bahrawy, Phase Retarders with Variable Angles of Total Internal Reflection, Appl. Opt., 33 (1994) 1218–1222.

    Article  ADS  Google Scholar 

  2. J.M. Bennett, A Critical Evaluation of Rhomb-Type Quarterwave Retarders, Appl. Opt., 9 (1970) 2123–2129.

    Article  ADS  Google Scholar 

  3. I.N. Shklayarevskii, V.P. Kostyuk, L.G. Lelyuk and R.G. Yarovaya, On the Magnitude and Sign of the Phase Difference ∆ = δ p − δ s Resulting from Total Internal Reflection, Opt. Spectrosc., 18 (1965) 476–478.

    ADS  Google Scholar 

  4. N.N. Nagib, Theory of Oblique-Incidence Phase Retarders, Appl. Opt., 36 (1997) 1547–1552.

    Article  ADS  Google Scholar 

  5. N.N. Nagib, Oblique Incidence in Total Internal Reflection Phase Retarders I: Theory and Design Considerations, Opt. Pura Y Appl., 27 (1994) 105–110.

    Google Scholar 

  6. N.N. Nagib, M.S. El-Bahrawy, S.E. Demian, S.Khodier, Oblique Incidence in Total Internal Reflection Phase Retarders II: Applications, Opt. Pura Y Appl., 27 (1994) 111–116.

    Google Scholar 

  7. N.N. Nagib, S.A. Khodier, Optimization of a Rhomb-Type Quarter-Wave Phase Retarder, Appl. Opt., 34 (1995) 2927–2930.

    Article  ADS  Google Scholar 

  8. N.N. Nagib, Phase Retarders Highly Insensitive to the Input Angle, Appl. Opt., 37 (1998) 1231–1235.

    Article  ADS  Google Scholar 

  9. N.N. Nagib, Total Internal Reflection Phase Retarders Constructed from Prisms, J. Opt. A: Pure Appl. Opt., 6 (2004) 425–428.

    Article  ADS  Google Scholar 

  10. N.N. Nagib, Prism-Type Retroreflector of Stable Quarterwave Retardance Over Extended Spectral Ranges, Opt. Laser Technol., 49 (2013) 47–50.

    Article  ADS  Google Scholar 

  11. W.A. Shurcliff, Polarized Light Production and Use, Oxford University Press, London, (1962) p. 106.

    Book  Google Scholar 

  12. H. de Sénarmont, Sur les modifications que la réflexionspéculaire à la surface des corps métalliquesimprime à un rayon de lumière polarisée, Ann. Chim. Phys., 73 (1840) 337–353.

  13. H.G. Jerrard, The Calibration of Quarter-Wave Plates, J. Opt. Soc. Am. 42 (1952) 159–161.

    Article  ADS  Google Scholar 

  14. R.R. Alfano and W.H. Woodruff, Calibration of an Optical Compensator by Ellipsometry, Appl. Opt., 5 (1966) 352.

    Article  ADS  Google Scholar 

  15. P. Daveze, H. Sahsah and J. Monin, A New Automatized Device for High-Precision Measurements of Optical Retarder Plates, Meas. Sci. Technol. 7 (1996) 157–161.

    Article  ADS  Google Scholar 

  16. W. Wang and J. Chen, Simple Method for Simultaneous Determination of the Phase Retardation and Fast Axis of a Wave Plate, Optik, 124 (2013) 4359–4363.

    Article  ADS  Google Scholar 

  17. H.K. Aben, On the Theory of Composite Quarterwave Plate, Opt. Spektrosk., 13 (1962) 746–750.

    Google Scholar 

  18. H.K. Aben, Some Cases of Superposition of Two Birefringent Plates, Opt. Spektroskop., 15 (1963) 682–689.

    Google Scholar 

  19. C.C. Montarou and T.K. Gaylord, Two-Wave-Plate Compensator Method for Single Point Retardation Measurements, Appl. Opt., 43 (2004) 6580–6895.

    Article  ADS  Google Scholar 

  20. C.C. Montarou, T.K. Gaylord, B.L. Bachim, A.I. Dachevski and A. Agarwal, Two-Wave-Plate Compensator Method for Full-Field Retardation Measurements, Appl. Opt., 45 (2006) 271–280.

    Article  ADS  Google Scholar 

  21. N.N. Nagib, New Formulas for Phase Retardance Measurements of Birefringent Plates, Opt. Laser Technol., 31 (1999) 309–313.

    Article  ADS  Google Scholar 

  22. N.N. Nagib, Phase Retardometer: A Proposed Device for Measuring Phase Retardance, Appl. Opt., 39 (2000) 2078–2080.

    Article  ADS  Google Scholar 

  23. N.N. Nagib, S.A. Khodier, M.S. Khalil and H.M. Sidki, Simultaneous Spectral Calibration of Two Phase Plates, Opt. Laser Technol., 31 (1999) 517–519.

    Article  ADS  Google Scholar 

  24. N.N. Nagib and S.A. Khodier, Applications of the Poincaré Sphere in Polarization Metrology, Opt. Laser Technol., 32 (2000) 373–377.

    Article  ADS  Google Scholar 

  25. N.N. Nagib, Polarization Metrology: Advanced Treatment of the Senarmont Compensator Arrangement for Calibrating Phase Plates, Metrologia, 38 (2001) 253–257.

  26. N.N. Nagib and N.A. Mahmoud, On the Theory of Simultaneous Retardance Measurement of Two Phase Plates, Optik, 127 (2016) 5597–5602.

    Article  ADS  Google Scholar 

  27. N.N. Nagib, M.S. Bahrawi, L.Z. Ismail, M.H. Othman and A.W. Abdallah, Evaluation of a Photometric Method for Retardance Measurement of a Quarterwave Phase Plate, Opt. Laser Technol., 69 (2015) 77–79.

    Article  ADS  Google Scholar 

  28. N.N. Nagib, Four-Measurement Technique Forelimination of Errors in Phase Plates Calibration, Meas. Sci. Technol., 15 (2004) 1166–1174.

    Article  ADS  Google Scholar 

  29. N.N. Nagib, The General Theory for Calibrating Two Arbitrarily Oriented Phase Plates, Opt. Laser Technol., 37 (2005) 151–155.

    Article  ADS  Google Scholar 

  30. M.S. El-Bahrawi, N.N. Nagib, S.A. Khodier and H.M. Sidki, Birefringence of Muscovite Mica, Opt. Laser Technol., 30 (1998) 411–415.

    Article  ADS  Google Scholar 

  31. N.N. Nagib, S.A. Khodier, H.M. Sidki and A.A. Abd El Megeed, Polymeric Sheets as Phase Retardation Elememts, Meas. Sci. Technol., 12 (2001) 1714–1717.

    Article  ADS  Google Scholar 

  32. N.N. Nagib, S.A. Khodier, A.A. Abd El Megeed and H.A. Soliman, Effect of γ-Radiation on the Birefringence of Polyethylene Films, Opt. Laser Technol., 36 (2004) 361–364.

    Article  ADS  Google Scholar 

  33. N.N. Nagib, S.A. Khodier, H.M. Sidki, Retardation Characteristics and Birefringence of a Multiple-Order Crystalline Quartz Plate, Opt. Laser Technol., 35 (2003) 99–103.

    Article  ADS  Google Scholar 

  34. S. Pancharatnam, Achromatic Combinations of Birefringent Plates. Part I An Achromatic Circular Polarizer, Proc. Indian Acad. Sci., 41 (1955) 137–144.

  35. H.G. Jerrard, Transmission of Light Through Birefringent and Optically Active Media: The Poincaré Sphere, J. Opt. Soc. Am., 44 (1954) 634–640.

    Article  ADS  Google Scholar 

  36. N.N. Nagib, M.S. Bahrawi, L.Z. Ismail, M.H. Othman and A.W. Abdallah, Polarization Metrology: Alignment of Polarizing Prisms in Optical Polarization systems, Opt. Laser Technol., 54 (2013) 42–44.

    Article  ADS  Google Scholar 

  37. M. El Sherif, M. Khalil, S. Khodier and N. Nagib, Simple Depolarizers for Spectrophotometric Measurements of Anisotropic Samples, Opt. Laser Technol., 28 (1996) 561–563.

    Article  ADS  Google Scholar 

  38. N.N. Nagib, S.A. Khodier and H.M. Sidki, Polarimetric Calibration of Angles, Meas. Sci. Technol., 14 (2003) 2135–2138.

    Article  ADS  Google Scholar 

  39. M. ArifSanjid and K.P. Chaudhary, Validation of Software Used for Calibration of Angle Block at CSIR-NPL, India, MAPAN-J. Metrol. Soc. India, 31 (2016) 31–41.

    Google Scholar 

  40. N.N. Nagib, N.A. Mahmoud, L.Z. Ismail, M.A. Amer and Kh. Abd-El-Sabour, Effect of Surface Roughness on the Optical Constants of bulkpolycrystalline Gold Samples, Optik, 125 (2014) 1085–1087.

    Article  ADS  Google Scholar 

  41. N.N. Nagib, M.S. Bahrawi, H. Osman, N.A. Mahmoud, H.M. Osman and A.W. Abdallah, A Precise Method for Determining the Principal Angle of Incidence and the Optical Constants of Metals, Meas. Sci. Technol., 27 (2016) 015009.

    Article  ADS  Google Scholar 

  42. M. ArifSanjid, K.P. Chaudhary and R.P. Singhal, Proficiency Testing for Surface Roughness Standard and Groove Depth, MAPAN-J. Metrol. Soc. India, 23 (2008) 11–20.

    Google Scholar 

  43. B. Dhanasekar and B. Ramamoorthy, Evaluation of Surface Roughness Using a Image Processing and Machine Vision System, MAPAN-J. Metrol. Soc. India, 21 (2006) 9–15.

    Google Scholar 

  44. G. Moona, R. Sharma, U. Kiran and P. Chaudhary, Evaluation of Measurement Uncertainty for Absolute Flatness Measurement by Using Fizeauinterferometer with Phase-Shifting Capability, MAPAN-J. Metrol. Soc. India, 29 (2014) 261–267.

    Google Scholar 

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  1. National Institute for Standards, P O Box 136, Giza, 12211, Egypt

    N. N. Nagib

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Nagib, N.N. Problems in Polarization Metrology. MAPAN 33, 1–7 (2018). https://doi.org/10.1007/s12647-017-0231-7

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  • DOI: https://doi.org/10.1007/s12647-017-0231-7

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