Abstract
A description is presented of some basic configurations and properties of defects in crystalline solids. The current theoretical and empirical descriptions of deformation are reviewed in relation to these defects (or imperfections), which may be planar, linear or confined to only one lattice point.
The techniques of electron microscopy and X-ray diffraction used in the examination of defects are briefly summarized. Planar defects can generally be detected by optical techniques, which, under certain conditions, may also reveal dislocations. Individual dislocations, their movement and interaction can, however, be observed most clearly by thin-film electron-transmission techniques. The direct observation of vacancies has been possible in only a restricted number of cases by using field-ion emission. X-ray diffraction has proved useful in obtaining information about both planar and line defects (i.e., stacking faults and dislocations).
The stress-strain curve of both single- and polycrystalline materials can be understood and described reasonably well in terms of the type, density and distribution of dislocations, determined by the use of the various techniques for observing them. Details are given in the paper. Knowledge of the microstructure at the atomic level is of great value in assessing past histories and possible future behavior of crystalline materials.
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Paper is devoted to plastic behavior of materials and is largely concerned with crystal defects
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Otte, H.M., Hren, J.J. The observation of crystalline imperfections and their role in plastic deformation. Experimental Mechanics 6, 177–193 (1966). https://doi.org/10.1007/BF02326148
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DOI: https://doi.org/10.1007/BF02326148