Abstract
A new and highly sensitive strain transducer has been developed using a thin-film semiconductor deposited on a polished piezoelectric ceramic substrate. Field-effect coupling has been found to exist between the substrate and film in which the number of mobile carriers in the semiconductor is dependent on the electric-displacement vector of the substrate. Therefore, the conductivity of the semiconducting film can be altered by piezoelectric charge due to a strain applied to the substrate material. An effective gage constant has been calculated in terms of the piezoelectric and elastic constants of the substrate and electronic properties of the film. Experimental devices were constructed by depositingp type tellurium on polished lead-zirconate-titanate ceramic resulting in experimentally observed gage factors as high as 5800 compared to 100–200 for conventional semiconductor gages. The semiconductor film exhibits an electronic instability that limits its use, at present, to transient measurements with frequencies above 1 Hz. Data will also be presented to show that the gage constant is continuously variable between a positive and negative maximum value by altering the magnitude and direction of the substrate-polarization vector. It is believed that these gages will be useful in those cases where extremely small strains (∼10−7) are to be measured or when moderate strains (∼10−4) are to be determined in an electrically noisy background.
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This work was supported by the U.S. Atomic Energy Commission.
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Crawford, J.C. A piezoelectric field-effect strain gage. Experimental Mechanics 11, 145–152 (1971). https://doi.org/10.1007/BF02324905
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DOI: https://doi.org/10.1007/BF02324905