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241Am-XRF analysis of rare earths in geological samples

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Abstract

Rare earths in sediments are analyzed by X-ray fluorescence using241Am as an excitation source. The analytical sensitivity lies in the ppm range.

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Authors and Affiliations

  1. Laboratoire de Chimie Nucléaire, Centre de Recherches Nucléaires, B. P. 20, 67037, Strasbourg Cedex, France

    G. Lagarde & J. Larcher

Authors
  1. G. Lagarde
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  2. J. Larcher
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Lagarde, G., Larcher, J. 241Am-XRF analysis of rare earths in geological samples. Journal of Radioanalytical and Nuclear Chemistry Letters 105, 341–349 (1986). https://doi.org/10.1007/BF02166345

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  • DOI: https://doi.org/10.1007/BF02166345

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