Abstract
The basic equations for a new semiempirical multielement calibration model for X-ray fluorescence analysis of thick samples are derived. Two main cases are considered: determination of all elements in the sample and determination of only a few selected elements. Advantages and disadvantages of the described calibration method are discussed. The method was applied to real samples and its results were compared to those obtained by multiple regression methods.
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Stoev, K.N., Dlouhy, J.F. Semiempirical model for X-ray fluorescence analysis combining concentration correction equations and backscatter radiation method. Journal of Radioanalytical and Nuclear Chemistry Letters 176, 415–428 (1993). https://doi.org/10.1007/BF02163388
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DOI: https://doi.org/10.1007/BF02163388