Abstract
The fundamental parameter (FP) approach, in which the both intensities of coherently (Rayleigh) and incoherently (Compton) scattered primary radiation are added individually to estimate the ‘dark matrix’ of the analyzed specimen, is considered successful, especially for in situ element determination. However, the current energy resolution of the energy-dispersive X-ray fluorescence (EDXRF) spectrometer system is not yet high enough for two scattered peaks to appear without overlapping in general, and separating two peaks with each other yields reduced accuracy of analysis. The FP approach with only the integrated backscattering intensity added in place of both of the individual backscatter intensities is proposed for X-ray fluorescence (XRF) analysis of unknown specimen. The present results show that the weight fraction deviations are below 5%, which is much lower than the maximum error 10.79% of the results for four selected samples by using the previous BFP. Our determination of elements reveals Na, Mg, Al, and Si as hypothetical elements representing compositions SiO2 and Al2O3, namely the main compositions of the gangue for the geological samples as a mineral ore.
Similar content being viewed by others
References
H. Zhang, D. Sun, J. Luo et al., Appl. Phys. A 125, 726 (2019)
I.A. Al-Nasr, I.J. Jabr, K.A. Al-Saleh et al., Appl. Phys. A 43, 71 (1987)
A. Bustamante, R. Cesareo, A. Brunetti et al., Appl. Phys. A 113, 1065 (2013)
S. Sfarra, C. Ibarra-Castanedo, S. Ridolfi et al., Appl. Phys. A 115, 1041 (2014)
A. Gianoncelli, G. Kourousias, Appl. Phys. A 89, 857 (2007)
R. Arletti, G. Vezzalini, S. Quartieri et al., Appl. Phys. A 92, 127 (2008)
K.K. Nielson, Anal. Chem. 49, 641 (1977)
D. Wegrzynek, A. Markowicz, E. Chinea, X-Ray Spectrom. 32, 119 (2003)
V.D. Hodoroaba, V. Rackwitz, Anal. Chem. 86, 6858 (2014)
Y. Sasaki, K. Hirokawa, Appl. Phys. A 50, 397 (1990)
L. Bertrand, L. Robinet, M. Thoury et al., Appl. Phys. A 106, 377 (2012)
I. Nakai, Y. Abe, Appl. Phys. A 106, 279 (2012)
E. Arizio, E.F. Orsega, G. Sommariva et al., Appl. Phys. A 111, 733 (2013)
M.K. Donais, J. Van Pevenage, A. Sparks et al., Appl. Phys. A 122, 1050 (2016)
F. Casadio, V. Rose, Appl. Phys. A 111, 1 (2013)
R. Tertian, F. Claisse, Principles of Quantitative X-Ray Fluorescence Analysis (Heyden, London, 1982)
G.R. Lachance, F. Claisse, Quantitative X-Ray Fluorescence Analysis (Wiley, New York, 1994)
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Jin, HS., Ri, C. & Jong, YS. Application of fundamental parameter approach using integrated backscattering intensity for X-ray fluorescence analysis. Appl. Phys. A 126, 318 (2020). https://doi.org/10.1007/s00339-020-03493-7
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s00339-020-03493-7