Abstract
The etching of fresh and grown-in dislocations on the chemically polished (100) surface of Fe-3% Si alloy single crystals and fresh dislocations on the same surface of Fe-7% Si alloy single crystals in a 1–2% nital is described. Antiphase domain boundaries are revealed by the same etching on the surfaces of Fe-7% Si alloy single crystals with different crystallographic orientation.
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The author is grateful to Dr.šesták for helpful discussions during the course of this investigation and to Dr. Kroupa for reading the manuscript.
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Kadečková, S. Etch pits on fresh and grown-in dislocations and etching of antiphase domain boundaries in Fe-Si alloys. Czech J Phys 19, 1178–1179 (1969). https://doi.org/10.1007/BF01691763
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DOI: https://doi.org/10.1007/BF01691763