Abstract
The activation area of plastically deformed Cd + 0·08 at% Sn single crystals was determined from differential creep test and stress relaxation at temperatures 78 K, 200 K and 295 K. The activation areaA depends on the resolved shear stress, τ,A * ∼τ −r wherer is dependent on temperature and the testing method used. For temperatures above 0·3T m recovery during stress relaxation should be considered.
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Stejskalová, V., Hamerský, M. & Lukáč, P. Thermoactivated creep and stress relaxation in Cd + 0·08 at% Sn single crystals. Czech J Phys 31, 932–936 (1981). https://doi.org/10.1007/BF01603790
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DOI: https://doi.org/10.1007/BF01603790