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X-ray photoelectron (XPS) and Auger (XAES) spectroscopy study of rhodium dispersed on carbon substrate

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Czechoslovak Journal of Physics B Aims and scope

Abstract

Photoelectron 3d5/2 binding and Auger M5VV kinetic energies of dispersed rhodium have been measured. For the smallest deposition of Rh the shifts 0·6 eV and -2·5 eV of 3d5/2 and M5VV lines respectively have been found. Electron core level energy, Auger kinetic energy and Fermi edge shifts have been interpreted by a model based on electrostatic relaxation mechanism in metal particles and initial state contribution of surface atoms. Intensity and background height analysis indicate only surface distribution of Rh.

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Authors and Affiliations

  1. ESCA Centre, J. Heyrovský Institute of Physical Chemistry and Electrochemistry, Czechosl. Acad. Sci., Vlašská 9, 11840, Praha 1, Czechoslovakia

    V. Anděra

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  1. V. Anděra
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I wish to express my gratitude to Dr. Zdeněk Bastl for helpful discussions.

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Anděra, V. X-ray photoelectron (XPS) and Auger (XAES) spectroscopy study of rhodium dispersed on carbon substrate. Czech J Phys 37, 625–637 (1987). https://doi.org/10.1007/BF01597192

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  • DOI: https://doi.org/10.1007/BF01597192

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