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A rational evaluation of fibre textures of thin solid films from electron diffraction patterns

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Czechoslovak Journal of Physics B Aims and scope

Abstract

A simple algebraic criterion based on reciprocal lattice geometry was established. It allows a straightforward construction of the distribution of intensity peaks on an electron diffraction pattern along layer lines associated with any crystallographic direction. It can be used to determine the fibre texture axis in materials composed of crystals of arbitrary symmetry. The method was applied to the determination of the fibre texture of thin films of PbO.

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References

  1. Barrett C. S., Structure of Metals, New York McGraw Hill 1952.

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  2. Zachariasen W. H., Theory of X-ray Diffraction in Crystals, New York Dover Publications 1967.

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  3. Strunz H., Mineralogische Tabellen, Leipzig Akademische Verlagsgesellschaft 1970.

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Authors and Affiliations

  1. Institute of Solid State Physics, Czechosl. Acad. Sci., Prague, Cukrovarnická 10, 162 53, Praha 6, Czechoslovakia

    V. Syneček, J. Hybler (Postgradual Fellowship) & M. Rozsíval

  2. Department of Mineralogy, Geochemistry and Crystallography, Faculty of Sciences, Charles University, Albertov 6, 128 43, Praha 2

    J. Hybler (Postgradual Fellowship)

Authors
  1. V. Syneček
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  2. J. Hybler
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  3. M. Rozsíval
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Syneček, V., Hybler, J. & Rozsíval, M. A rational evaluation of fibre textures of thin solid films from electron diffraction patterns. Czech J Phys 23, 1027–1037 (1973). https://doi.org/10.1007/BF01586840

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  • DOI: https://doi.org/10.1007/BF01586840

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