Abstract
Diffuse reflectance of strongly absorbing sample layers is calculated in dependence of their thicknesses from the Kubelka-Munk theory. The results are compared to experimental ones from varnish layers on reflecting metal substrates.
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References
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Otto, A., Körte, EH. Sampling depth in infrared diffuse reflection spectroscopy of undiluted samples. Mikrochim Acta 95, 141–144 (1988). https://doi.org/10.1007/BF01349739
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DOI: https://doi.org/10.1007/BF01349739