Abstract
Infrared (IR) spectrometry is a representative un-destructive spectroscopic analytical technique, which provides rich molecular information such as molecular conformation, polymorph, packing and orientation. Another significant benefit of using IR spectroscopy is the sensitivity, which is good enough for analyzing monolayer-level thin films. Considering the great quantitative reproducibility, IR spectroscopy is one of the first choices to analyze an ultrathin film particularly of an organic compound. Here, IR reflection spectrometry on a nonmetallic surface, which is called “external reflection,” is described.
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Hasegawa, T. (2018). Infrared External-Reflection Spectroscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_47
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DOI: https://doi.org/10.1007/978-981-10-6156-1_47
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