Abstract
By a method specially developped for high accuracy, the weak absorption of thin dielectric films was measured and coefficients of absorption were evaluated. Results are stated for such substances as cryolithe, MgF2, NaF, paraffin, ZnS and Sb2O3, which are used for the production of dielectric reflecting films.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Koppelmann, G., Krebs, K. Bestimmung schwacher Absorptionen in dünnen dielektrischen Schichten. Z. Physik 156, 38–54 (1959). https://doi.org/10.1007/BF01332514
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01332514