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Microhardness response of nitrogen-implanted and X-irradiated lithium fluoride

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Abstract

The microhardness behaviour of {001} faces of LiF has been investigated before and after both nitrogen-ion implantation and implantation followed by X-irradiation. Implantation alone produced no changes in either hardness or dislocation etch-pit rosette sizes on the surface, though radial indentation fracture was promoted. Implantation followed by X-irradiation produced high densities of colour centres deep into the crystal, much deeper than the implantation damage depth (∼0.2μm). Hardness and rosette sizes were affected to depths of ∼150μm, which was less than the colouration depth. Thus the “colour centres” producing the colour are probably different from those impeding dislocation motion.

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Roberts, S.G., Page, T.F. Microhardness response of nitrogen-implanted and X-irradiated lithium fluoride. J Mater Sci 21, 4385–4390 (1986). https://doi.org/10.1007/BF01106560

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