Abstract
Ellipsometry was used to measure the complex index of refraction of liquid solutions of nickel and silicon over the wavelength range from 0.4 to 1.0μ. The silicon content in the solutions had the values 0.0, 5.0, 11.0, 16.0, 24.9, 32.4, 47.1, 75 and 100% Si. From the experimental data, parameters including the carrier concentrations, their relaxation times and a number of other electronic properties were calculated based on the free electron approximation. The degree of localization of valence electrons was also estimated.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 96–99, April, 1974.
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Shvarev, K.M., Baum, B.A. & Gel'd, P.V. Optical properties and electronic characteristics of liquid solutions of nickel in silicon. Soviet Physics Journal 18, 521–524 (1975). https://doi.org/10.1007/BF01093245
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DOI: https://doi.org/10.1007/BF01093245