Abstract
A new rate equation fits data on the oxidation of silicon by oxygen. It can be derived from a model of molecular diffusion in the oxide layer and the influence of strain on this diffusion.[/p]
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References
B. E. Deal andA. S. Grove,J. Appl. Phys. 36 (1965) 3770.
N. R. Draper andH. Smith, “Applied Regression Analysis”, (Wiley, New York, 1981) Ch. 10.
B. J. Korites, “Data Plotting, Software for Micros” (Kem Publications, Duxbury, Massachusetts).
D. C. Montgomery andE. A. Peck, “Introduction to Linear Regression Analysis”, (Wiley, New York, 1982) p. 88ff.
B. E. Deal, D. W. Hess, J. D. Plummer andC. P. Ho,J. Electrochem. Soc. 125 (1978) 339.
H. Z. Massoud, PhD thesis, Stanford University (1983).
J. R. Ligenza andW. G. Spitzer,J. Phys. Chem. Solids 14 (1960) 131.
K. Hirabayaski andJ. Iwamura,J. Electrochem. Soc. 120 (1973) 1595.
E. A. Irene andR. Ghez,ibid. 124 (1977) 1757.
F. J. Norton,Nature 191 (1961) 701.
R. H. Doremus,J. Phys. Chem. 80 (1976) 1773.
R. R. Razouk, L. N. Lie andB. E. Deal,J. Electrochem. Soc. 128 (1981) 2214.
R. H. Doremus,Thin Solid Films 122 (1984) 191.
N. F. Mott,Proc. R Soc. A376 (1981) 207.
Idem, Phil. Mag. 45 (1981) 323.
B. Borie, C. J. Sparks andJ. V. Cathcart,Acta Metall. 10 (1962) 691.
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Doremus, R.H., Szewczyk, A. Oxidation of silicon by oxygen: a rate equation. J Mater Sci 22, 2887–2892 (1987). https://doi.org/10.1007/BF01086486
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DOI: https://doi.org/10.1007/BF01086486