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Methods of measuring low-frequency noise

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

Conclusions

1. The measurement of the noise of semiconductor instruments in the range of infrasonic frequencies is of great scientific and practical interest. 2. At present various methods and equipment have been developed for measuring the characteristics of noise at frequencies right down to 5·10−5 Hz. 3. The measurement of low-frequency noise by the method of frequency-spectrum transformation (the magnetic-tape method) is at present not sufficiently acceptable. 4. Comparative methods of measurement using analog RC filters and a counting voltmeter are the most promising; these methods can be used to measure noise in the frequency range from several hertz down to frequencies of the order of 10−5 Hz.

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Authors
  1. B. D. Zaitsev
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  2. I. P. Stepanenko
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  3. E. E. Shvedov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 43–46, June, 1970.

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Zaitsev, B.D., Stepanenko, I.P. & Shvedov, E.E. Methods of measuring low-frequency noise. Meas Tech 13, 871–876 (1970). https://doi.org/10.1007/BF01061554

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  • DOI: https://doi.org/10.1007/BF01061554

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