Abstract
This article presents SPLASH, an algorithm that can sensitize several independent bitpaths simultaneously. SPLASH includes several new concepts and techniques aiming at a significant improvement and acceleration of the path sensitization for testing embedded modules in combinational and synchronous sequential circuits. The transparent paths are used to apply module test patterns through circuit inputs and observe the responses at circuit outputs. It consequently automates an important task of modular test generation, supplying a test pattern assembly program with a specification how to transform module test patterns into circuit level pattern.
A number of experiments using combinational and sequential benchmark circuits as well as industrial designs demonstrate the efficiency of the approach.
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Keutner, K., Trischler, E. Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. J Electron Test 6, 45–58 (1995). https://doi.org/10.1007/BF00993129
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DOI: https://doi.org/10.1007/BF00993129