Skip to main content
Log in

Background-invariant detection and measurement of analytical signals of x-ray spectrometers

  • Physicochemical Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

Statistical tests for the detection and determination of background-invariant trace elements have been synthesized for Poisson x-ray fluxes in spectrum-analyzer channels. Cases of total and partial a prioriindeterminacy of the intensities of x-ray fluxes were considered. The tests were used on an energy-dispersion spectrometer to determine lanthanum aqueous solutions.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. M. A. Sharaf, D. L. Illmen, and B. R. Koval'skii, Chemometrics [in Russian], Khimiya, Leningrad (1989).

    Google Scholar 

  2. R. Muller, Spectrochemical Analysis by X-Ray Fluorescence, Plenum Press, New York (1972).

    Google Scholar 

  3. R. Waldset, Applied X-ray Spectrometry [Russian translation], Atomizdat, Moscow (1977).

    Google Scholar 

  4. G. M. Bashin, A. T. Savichev, and M. S. Khots, Zh. Anal. Khim.,48, No. 5, 827 (1993).

    Google Scholar 

  5. G. M. Bashin and A. T. Savichev, Zh. Anal. Khim.,48, No. 11, 26 (1993).

    Google Scholar 

  6. V. P. Afonin et al., Zh. Anal. Khim.,37, No. 7, 1239 (1982).

    Google Scholar 

  7. M. G. Kendall and A. Stuart, Statistical Inference and Relations [Russian translation], Nauka, Moscow (1973).

    Google Scholar 

  8. A. N. Dmitrienko, Radiotekh. Élektron.,31, No. 8, 1541 (1986).

    Google Scholar 

Download references

Authors

Additional information

Translated from Izmeritel'naya Tekhnika, No. 12, pp. 47–49, December, 1995.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Bashin, G.M., Dmitrienko, A.N. & Savichev, A.T. Background-invariant detection and measurement of analytical signals of x-ray spectrometers. Meas Tech 38, 1388–1393 (1995). https://doi.org/10.1007/BF00990500

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00990500

Keywords

Navigation